Anavex Life Sciences Corp (AVXL)

[nidan7500]

How to prove CNS diseases failure root causes?
As someone who spent many years/decades engineering/testing and developing semiconductor devices I am amazed to see the basics in what REALLY causes-contributes-accelerates human CNS (systems) failure is not well understood-or proven.

https://www.sciencedirect.com/science/article/abs/pii/S0026271417304985

Up until the mid 60's semiconductor devices were a lab novelty w/so many problems which prevented full commercial volume and uses (stability-reliability being the biggest BLACK hole) . Imagine our world today w/o microprocessors or integrated ckts or even reliable diodes. There would be no WW communication systems or electronics wonders had the basic early failure physics mechanisms not been understood. (BTW those failure physics still exist in nature but we have since engineered ways to fix/prevent/control them through solid manufacturing controls) .

All of the basic failure mechanisms were wrung out by smart-hard working people at Bell Labs and in a few other places (MIT) WW once the mechanisms were proven. I find it curious that CNS medical systems are stuck w/no basic tool suite to work on/engineer the CNS issues after decades. WE are still beating Amyloid Plaques after 50+ years and getting no where.

The biggest breakthroughs in semiconductor physics happened when Dr. Connie Zerdt (sp?) at Bell labs introduced accelerated failure tools. No such tool suite exists in CNS tool box (yet) . Research in CNS failure mechanisms has consequently not figured out how to accelerate (speed up ) CNS brain failures in a lab. Consequently we/they wait years to study efficacy w/very little other than time, as a control. Find a way to accelerate CNS micro failures & root causes.

Find a way to accelerate brain shrinkage (if that is an important metric) . By doing accelerated testing we will easily get better (more predictable results) faster. The rate of progress in CNS root cause analysis is mid-evil...THX FDA. When key failure micro variables are understood then accelerated test modes will prove the root causes very quickly and then results will jump off the page. Bottom line, accelerated failure models/concepts are bullet proof.

As long as the current (time driven) investigation methods are used no high confidence processes (accelerated failure models) can be developed and no solutions will be produced. BTW, in semiconductor research we discovered that Ionic Contaminants, poor designs and sloppy manufacturing practices resulted in unstable devices w/high failure rates. These failure mechanisms also exist today all BP unless they are measured and controlled.